Visual exploration of fault detection using machine learning and image processing

Babu, D. Vijendra and Jyothi, K. and Mishra, Divyendu Kumar and Dwivedi, Atul Kumar and Raj, E. Fantin Irudaya and Laddha, Shilpa (2023) Visual exploration of fault detection using machine learning and image processing. INTERNATIONAL JOURNAL OF ENGINEERING SYSTEMS MODELLING AND SIMULATION, 14.0 (1). pp. 8-15. ISSN 1755-9758

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Abstract

The machine learning CNN method defect detection is highly reliant on the training data; thus, post-classification regularisation may significantly improve the output. The suggested fault detection process may perform well on demanding synthetic and actual information by using a practical synthetic fault system depending on the SEAM model. We further propose the visual exploration be made more reliable regarding fault tolerance. The visual exploration model is made up of three-phase namely, visual identification and mapping, dynamic controller, and terminate criterion. The submap-dependent on visual mapping phase ensures higher mapping manageability, semantic classification dependent on active controller ensures continuous driving, and a new completion assessment technique ensures robust re-localisation under the terminate criterion. To preserve mapping and improve visual tracking, all the components are tightly linked. The proposed model machine learning CNN model is examined, and actual tests show fault-tolerance methods are proven to withstand visual monitoring and mapping failure situations.

Item Type: Article
Uncontrolled Keywords: visual exploration, fault detection, convolutional neural networks, CNNs, image processing
Subjects: Engineering > Engineering
Multi-Disciplinary Studies > Multidisciplinary
Divisions: Engineering and Technology > Aarupadai Veedu Institute of Technology, Chennai, India > Information Technology,
Engineering and Technology > Aarupadai Veedu Institute of Technology, Chennai, India > Electrical and Electronic Engineering
Engineering and Technology > Aarupadai Veedu Institute of Technology, Chennai, India > Computer Science and Engineering
Engineering and Technology > Aarupadai Veedu Institute of Technology, Chennai, India > Electronics and Communication Engineering
Engineering and Technology > Aarupadai Veedu Institute of Technology, Chennai, India > Information Technology,
Depositing User: Unnamed user with email techsupport@mosys.org
Last Modified: 06 Feb 2026 07:13
URI: https://ir.vmrfdu.edu.in/id/eprint/7188

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